納米材料的'表徵手段
摘要：本文介紹了納米材料的幾種主要表徵方法以及這些表徵方法的原理，對納米材料的行貌、成分、以及結構入手對納米材料的進行了有效研究。在納米材料形貌、成分和結構表徵中本文分別採用了原子力顯微鏡（AFM）、俄歇電子能譜（AES）、X射線光電子能譜(XPS)、 X射線衍線（XRD）分析。
關鍵字：納米材料；原子力顯微鏡；俄歇電子能譜；X射線光電子能譜；X射線衍射分析
Methods for Characterizing Nano-materials
Abstract: This article introduced the several methods to characterize nanometer material and the principle of these methods fires. Then the morphology、the ingredient and the structure of nanometer material is introduced. In the morphology study, the ingredient and the structure characterization this article separately used the Atomic Force Microscope (AFM), the Auger Electron Spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), X-ray photoelectron spectroscopy (XRD).
Key Words: Nanometer material; Atomic Force Microscope; Auger Electron Spectroscopy; X-ray photoelectron spectroscopy; X-ray Diffraction
......................